Anomalous small angle x‐ray scattering study of layered silicate clays containing Ni(II) and Er(III)
نویسندگان
چکیده
منابع مشابه
Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering
Semiconductor doped glasses containing CdSxSe12x nanocrystallites embedded in a silicate glass matrix were investigated. The dimensions of the nanocrystallites are in the range of a few nanometers and vary as a function of a secondary heat treatment. The confinement of such quantum dots for elementary excitations depends strongly on their size. In order to obtain a mean particle size and the si...
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Anomalous small-angle X-ray scattering (ASAXS) is expected to be a powerful and vital tool for the structural study of soft matter. We investigated feasibility of ASAXS near sulphur K absorption edge at SPring-8. Scattering pattern was successfully obtained and the dependence of scattering intensity on the energy of X-ray well agreed with the calculated one. This study can be the basis of struc...
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Small Angle Neutron Scattering (SANS) is a technique that enables to probe the 3-D structure of materials on a typical size range lying from ∼ 1 nm up to ∼ a few 100 nm, the obtained information being statistically averaged on a sample whose volume is ∼ 1 cm3. This very rich technique enables to make a full structural characterization of a given object of nanometric dimensions (radius of gyrati...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 1996
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1147355